Influence of Point Defect Concentration in Growing Cz-Si on the Formation Temperature of the Defects Affecting Gate Oxide Integrity

Iwasaki, T. / Harada, H. / Haga, H. | British Library Online Contents | 1995

Gate oxide integrity dependence on substrate characteristics and SiO2 thickness

Bonoli, F. / Godio, P. / Borionetti, G. et al. | British Library Online Contents | 2001

Review of the Influence of Micro Crystal Defects in Silicon Single Crystals on Gate Oxide Integrity

Fusegawa, I. / Takano, K. / Kimura, M. et al. | British Library Online Contents | 1995

Thickness dependent integrity of gate oxide on SOI

Tsujiuchi, M. / Iwamatsu, T. / Naruoka, H. et al. | British Library Online Contents | 2003

Numerical study of annular flaws/defects affecting the integrity of grouted composite sleeve repairs on pipelines

Sum, W.S. / Leong, K.H. / Gibson, A.G. et al. | Tema Archiv | 2014