Substrate defects affecting gate oxide integrity

Itsumi, M. | British Library Online Contents | 2000

Thickness dependent integrity of gate oxide on SOI

Tsujiuchi, M. / Iwamatsu, T. / Naruoka, H. et al. | British Library Online Contents | 2003

Memory characteristics of Al2O3/LaAlO3/SiO2 multilayer structures with tunnel oxide thickness variation

Cha, S. Y. / Kim, H. J. / Choi, D. J. | British Library Online Contents | 2010

MBE lanthanum-based high-k gate dielectrics as candidates for SiO2 gate oxide replacement

Vellianitis, G. / Apostolopoulos, G. / Mavrou, G. et al. | British Library Online Contents | 2004

Dependence of barrier height and effective mass on nitrogen concentration at SiO~xN~y/Si interface and gate oxide thickness

Ng, C. Y. / Chen, T. P. / Ang, C. H. | British Library Online Contents | 2006