Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
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Influence of Czochralski silicon crystal growth on wafer quality: an extensive investigation using traditional and new characterization techniques
Influence of Czochralski silicon crystal growth on wafer quality: an extensive investigation using traditional and new characterization techniques
Influence of Czochralski silicon crystal growth on wafer quality: an extensive investigation using traditional and new characterization techniques
Porrini, M. (Autor:in) / Collareta, P. (Autor:in) / Borionetti, G. (Autor:in) / Gambaro, D. (Autor:in) / Fini, I. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 73 ; 139 - 144
01.01.2000
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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