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Effect of native point defects on morphology of gettering centres in CZ-silicon wafers
Effect of native point defects on morphology of gettering centres in CZ-silicon wafers
Effect of native point defects on morphology of gettering centres in CZ-silicon wafers
Enisherlova, K. L. (Autor:in) / Rusak, T. F. (Autor:in) / Mil'vidskii, M. G. (Autor:in) / Reznick, V. J. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 36 ; 120-124
01.01.1996
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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