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Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
Rohmfeld, S. (Autor:in) / Hundhausen, M. (Autor:in) / Ley, L. (Autor:in) / Zorman, C. A. (Autor:in) / Mehregany, M. (Autor:in)
MATERIALS SCIENCE FORUM ; 338/342 ; 595-598
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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