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Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
Rohmfeld, S. (author) / Hundhausen, M. (author) / Ley, L. (author) / Zorman, C. A. (author) / Mehregany, M. (author)
MATERIALS SCIENCE FORUM ; 338/342 ; 595-598
2000-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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