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Molecular dynamics analysis of point defects in silicon near solid-liquid interface
Molecular dynamics analysis of point defects in silicon near solid-liquid interface
Molecular dynamics analysis of point defects in silicon near solid-liquid interface
Kakimoto, K. (Autor:in) / Umehara, T. (Autor:in) / Ozoe, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 159-160 ; 387-391
01.01.2000
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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