Diagnostics of the silicon-insulator interface structure by optical second-harmonic generation

Kravetsky, I. V. / Kulyuk, L. L. / Micu, A. V. et al. | British Library Online Contents | 1993

Molecular dynamics analysis of point defects in silicon near solid-liquid interface

Kakimoto, K. / Umehara, T. / Ozoe, H. | British Library Online Contents | 2000

Interface Defects of Bonded Silicon Wafers

Reiche, M. / Tong, Q.-Y. / Goesele, U. et al. | British Library Online Contents | 1995

Evolution of end-of-range defects in silicon-on-insulator substrates

Fazzini, P. F. / Cristiano, F. / Dupre, C. et al. | British Library Online Contents | 2008

Investigation of interface in silicon-on-insulator by fractal analysis

Liu, X. H. / Chen, J. / Chen, M. et al. | British Library Online Contents | 2002