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Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy
Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy
Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy
Masarotto, L. (Autor:in) / Bluet, J. M. (Autor:in) / Berenguer, M. (Autor:in) / Girard, P. (Autor:in) / Guillot, G. (Autor:in)
MATERIALS SCIENCE FORUM ; 353/356 ; 393-396
01.01.2001
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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