Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

Lindquist, O. P. A. / Arwin, H. / Forsberg, U. et al. | British Library Online Contents | 2000

Variable Angle Spectroscopic Ellipsometry investigation of CVD-grown monolayer graphene

Castriota, Marco / Politano, Grazia Giuseppina / Vena, Carlo et al. | British Library Online Contents | 2019

Sensitivity of variable angle of incidence spectroscopic ellipsometry to compositional profiles of graded Al~xGa~1~-~xAs-GaAs structures

Tonova, D. A. / Konova, A. A. | British Library Online Contents | 1994

Spectroscopic ellipsometry

British Library Online Contents | 2005

Anisotropic Dielectric Function Properties of Semi-Insulating 4H-SiC Determined from Spectroscopic Ellipsometry

Kildemo, M. / Mooney, M. B. / Kelly, P. V. et al. | British Library Online Contents | 2000