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Effect of process variables on the structure, residual stress, and hardness of sputtered nanocrystalline nickel films
Effect of process variables on the structure, residual stress, and hardness of sputtered nanocrystalline nickel films
Effect of process variables on the structure, residual stress, and hardness of sputtered nanocrystalline nickel films
Mitra, R. (Autor:in) / Hoffman, R. A. (Autor:in) / Madan, A. (Autor:in) / Weertman, J. R. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 16 ; 1010-1027
01.01.2001
18 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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