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Spectroellipsometric characterization of materials for multilayer coatings
Spectroellipsometric characterization of materials for multilayer coatings
Spectroellipsometric characterization of materials for multilayer coatings
Postava, K. (Autor:in) / Aoyama, M. (Autor:in) / Yamaguchi, T. (Autor:in) / Oda, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 175-176 ; 276-280
01.01.2001
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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