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Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry
Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry
Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry
Garcia-Serrano, J. (Autor:in) / Koshizaki, N. (Autor:in) / Sasaki, T. (Autor:in) / Martinez-Montes, G. (Autor:in) / Pal, U. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 16 ; 3554-3559
01.01.2001
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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