Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003

High resolution lifetime scan maps of silicon wafers

Palais, O. / Gervais, J. / Clerc, L. et al. | British Library Online Contents | 2000

Mapping of the local minority carrier diffusion length in silicon wafers

Stemmer, M. | British Library Online Contents | 1993

Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method

Suzuki, E. / Hayashi, Y. | British Library Online Contents | 1993