Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

Palais, O. / Yakimov, E. / Martinuzzi, S. | British Library Online Contents | 2002

Mapping of the local minority carrier diffusion length in silicon wafers

Stemmer, M. | British Library Online Contents | 1993

Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method

Suzuki, E. / Hayashi, Y. | British Library Online Contents | 1993

Application of UV Scanning Photoluminescence Spectroscopy for Minority Carrier Lifetime Mapping

Masarotto, L. / Bluet, J. M. / El Harrouni, I. et al. | British Library Online Contents | 2003