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Minority carrier lifetime and metallic-impurity mapping in silicon wafers
Minority carrier lifetime and metallic-impurity mapping in silicon wafers
Minority carrier lifetime and metallic-impurity mapping in silicon wafers
Palais, O. (Autor:in) / Martinuzzi, S. (Autor:in) / Simon, J. J. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 27-29
01.01.2001
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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