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TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures
TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures
TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures
Cherns, D. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 274 - 279
01.01.2002
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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