Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Influence of Implantation Temperature and Dose Rate on Secondary Defect Formation in 4H-SiC
Influence of Implantation Temperature and Dose Rate on Secondary Defect Formation in 4H-SiC
Influence of Implantation Temperature and Dose Rate on Secondary Defect Formation in 4H-SiC
Ohno, T. (Autor:in) / Amemiya, K. (Autor:in)
MATERIALS SCIENCE FORUM ; 389/393 ; 823-826
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Formation of Anomalous Defect Structure on GaSb Surface by Low Temperature Sn Ion-Implantation
British Library Online Contents | 2002
|Thermal stability of defect complexes due to high dose MeV implantation in silicon
British Library Online Contents | 2000
|Thermal stability of defect complexes due to high dose MeV implantation in silicon
British Library Online Contents | 2000
|Defect levels in n-silicon after high energy and high dose implantation of proton
British Library Online Contents | 1996
|British Library Online Contents | 1998
|