Impact of the Oxidation Temperature on the Interface Trap Density in 4H-SiC MOS Capacitors

Thomas, S.M. / Jennings, M.R. / Sharma, Y.K. et al. | British Library Online Contents | 2014

An experimental comparison of interface trap density in hafnium oxide-based FeFETs

Chaiwon Woo / Yannick Raffel / Ricardo Olivo et al. | DOAJ | 2023

Interface Trap Density and Mobility Characterization of Silicon Carbide MOSFET Inversion Layers

Tilak, V. / Matocha, K. / Dunne, G. | British Library Online Contents | 2009

Reduction of Density of 4H-SiC / SiO~2 Interface Traps by Pre-Oxidation Phosphorus Implantation

Sledziewski, T. / Mikhaylov, A. / Reshanov, S. et al. | British Library Online Contents | 2014

Low interface trap density in scaled bilayer gate oxides on 2D materials via nanofog low temperature atomic layer deposition

Kwak, Iljo / Kavrik, Mahmut / Park, Jun Hong et al. | British Library Online Contents | 2019