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Electron traps created in n-type GaN during 25 keV hydrogen implantation
Electron traps created in n-type GaN during 25 keV hydrogen implantation
Electron traps created in n-type GaN during 25 keV hydrogen implantation
Auret, F. D. (Autor:in) / Meyer, W. E. (Autor:in) / Goodman, S. A. (Autor:in) / Hayes, M. (Autor:in) / Legodi, M. J. (Autor:in) / Beaumont, B. (Autor:in) / Gibart, P. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 93 ; 6 - 9
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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