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Quantitative measurement of In fluctuation inside MOCVD InGaN QWs
Quantitative measurement of In fluctuation inside MOCVD InGaN QWs
Quantitative measurement of In fluctuation inside MOCVD InGaN QWs
Ruterana, P. (Autor:in) / Kret, S. (Autor:in) / Poisson, M. A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 93 ; 185 - 188
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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