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High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope
High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope
High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope
Hasegawa, T. (Autor:in) / Kageyama, T. (Autor:in) / Fukumura, T. (Autor:in) / Okazaki, N. (Autor:in) / Kawasaki, M. (Autor:in) / Koinuma, H. (Autor:in) / Yoo, Y. K. (Autor:in) / Duewer, F. (Autor:in) / Xiang, X. D. (Autor:in)
APPLIED SURFACE SCIENCE ; 189 ; 210-215
01.01.2002
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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