Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials
Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials
Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials
Okazaki, N. (Autor:in) / Odagawa, H. (Autor:in) / Cho, Y. (Autor:in) / Nagamura, T. (Autor:in) / Komiyama, D. (Autor:in) / Koida, T. (Autor:in) / Minami, H. (Autor:in) / Ahmet, P. (Autor:in) / Fukumura, T. (Autor:in) / Matsumoto, Y. (Autor:in)
APPLIED SURFACE SCIENCE ; 189 ; 222-226
01.01.2002
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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