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High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope
High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope
High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope
Hasegawa, T. (author) / Kageyama, T. (author) / Fukumura, T. (author) / Okazaki, N. (author) / Kawasaki, M. (author) / Koinuma, H. (author) / Yoo, Y. K. (author) / Duewer, F. (author) / Xiang, X. D. (author)
APPLIED SURFACE SCIENCE ; 189 ; 210-215
2002-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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