High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope: Fid-Bau Portal

High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope

Okazaki, S. / Okazaki, N. / Zhao, X. / Sugaya, H. / Yaginuma, S. i. / Takahashi, R. / Murakami, M. / Matsumoto, Y. / Chikyow, T. / Koinuma, H.

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High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope

Okazaki, S. / Okazaki, N. / Zhao, X. / Sugaya, H. / Yaginuma, S. i. / Takahashi, R. / Murakami, M. / Matsumoto, Y. / Chikyow, T. / Koinuma, H.

High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope

Okazaki, S. / Okazaki, N. / Zhao, X. / Sugaya, H. / Yaginuma, S. i. / Takahashi, R. / Murakami, M. / Matsumoto, Y. / Chikyow, T. / Koinuma, H.

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Bestellung bei Subito €

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Titel:

High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope

Beteiligte:

Okazaki, S. (Autor:in) / Okazaki, N. (Autor:in) / Zhao, X. (Autor:in) / Sugaya, H. (Autor:in) / Yaginuma, S. i. (Autor:in) / Takahashi, R. (Autor:in) / Murakami, M. (Autor:in) / Matsumoto, Y. (Autor:in) / Chikyow, T. (Autor:in) / Koinuma, H. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 252 ; 2615-2621

Erscheinungsdatum:

01.01.2006

Format / Umfang:

7 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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