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Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials
Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials
Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials
Okazaki, N. (author) / Odagawa, H. (author) / Cho, Y. (author) / Nagamura, T. (author) / Komiyama, D. (author) / Koida, T. (author) / Minami, H. (author) / Ahmet, P. (author) / Fukumura, T. (author) / Matsumoto, Y. (author)
APPLIED SURFACE SCIENCE ; 189 ; 222-226
2002-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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