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Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry
Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry
Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry
Komatsu, M. (Autor:in) / Ohashi, N. (Autor:in) / Sakaguchi, I. (Autor:in) / Hishita, S. (Autor:in) / Haneda, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 189 ; 349-352
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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