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Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry
Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry
Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry
Komatsu, M. (author) / Ohashi, N. (author) / Sakaguchi, I. (author) / Hishita, S. (author) / Haneda, H. (author)
APPLIED SURFACE SCIENCE ; 189 ; 349-352
2002-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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