Strain relaxation of Ge-implanted silicon wafers

Xiao, Q. / Tu, H. / Zhou, Q. et al. | British Library Online Contents | 2006

Implant damage and redistribution of indium in indium-implanted thin silicon-on-insulator

Chen, P. / An, Z. / Zhu, M. et al. | British Library Online Contents | 2004

Effect of thermal annealing on the microstructure of ytterbium-implanted silicon wafers

Yang, Y. / Chen, H. / Zhou, Y. Q. et al. | British Library Online Contents | 1997

Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry

Komatsu, M. / Ohashi, N. / Sakaguchi, I. et al. | British Library Online Contents | 2002

Microwave Dielectric Loss Characterization of Silicon Carbide Wafers

Bogart, T. / Everson, B. / Gamble, R. D. et al. | British Library Online Contents | 2006