Copper diffusivity in silicon: A re-examination

Mesli, A. / Heiser, T. / Mulheim, E. | British Library Online Contents | 1994

Delineation of Flow Pattern Defects in Heavily Boron-doped Czochralski Silicon Wafer

Fang, M. / Yang, D.-r. / Ma, X.-y. et al. | British Library Online Contents | 2006

Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique

Chen, X. / Zhu, J. / Yin, G. et al. | British Library Online Contents | 2006

Boron-doped silicon nano-wires

Niu, J. J. / Wang, J. N. / Chen, Y. X. | British Library Online Contents | 2007

Ga, N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry

Komatsu, M. / Ohashi, N. / Sakaguchi, I. et al. | British Library Online Contents | 2002