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Growth of electromigration-induced hillocks in Al interconnects
Growth of electromigration-induced hillocks in Al interconnects
Growth of electromigration-induced hillocks in Al interconnects
Nucci, J. A. (Autor:in) / Straub, A. (Autor:in) / Bischoff, E. (Autor:in) / Arzt, E. (Autor:in) / Volkert, C. A. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 2727-2735
01.01.2002
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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