Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy: Fid-Bau Portal

Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K. / Senthilkumar, M. / Thakur, S. / Bhattacharyya, D.

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Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K. / Senthilkumar, M. / Thakur, S. / Bhattacharyya, D.

Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K. / Senthilkumar, M. / Thakur, S. / Bhattacharyya, D.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Titel:

Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Beteiligte:

Sahoo, N. K. (Autor:in) / Senthilkumar, M. (Autor:in) / Thakur, S. (Autor:in) / Bhattacharyya, D. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 200 ; 219-230

Erscheinungsdatum:

01.01.2002

Format / Umfang:

12 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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Surface viscoelasticity studies of Gd2O3, SiO2 optical thin films and multilayers using force modulation and force-distance scanning probe microscopy

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