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Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy
Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy
Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy
Sahoo, N. K. (author) / Senthilkumar, M. (author) / Thakur, S. (author) / Bhattacharyya, D. (author)
APPLIED SURFACE SCIENCE ; 200 ; 219-230
2002-01-01
12 pages
Article (Journal)
English
DDC:
621.35
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