Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy: Fid-Bau Portal

Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K. / Senthilkumar, M. / Thakur, S. / Bhattacharyya, D.

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Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K. / Senthilkumar, M. / Thakur, S. / Bhattacharyya, D.

Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K. / Senthilkumar, M. / Thakur, S. / Bhattacharyya, D.

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Document information

Title:

Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Contributors:

Sahoo, N. K. (author) / Senthilkumar, M. (author) / Thakur, S. (author) / Bhattacharyya, D. (author)

Published in:

APPLIED SURFACE SCIENCE ; 200 ; 219-230

Publication date:

2002-01-01

Size:

12 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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