Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K. / Senthilkumar, M. / Thakur, S. et al. | British Library Online Contents | 2002

Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

Sahoo, N. K. / Tokas, R. B. / Thakur, S. | British Library Online Contents | 2006

Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Senthil, K. / Mangalaraj, D. / Narayandass, S. K. et al. | British Library Online Contents | 2000

Dielectric and optical constants of λ-Ti3O5 film measured by spectroscopic ellipsometry

Hakoe, Fumiyoshi / Tokoro, Hiroko / Ohkoshi, Shin-ichi | British Library Online Contents | 2017

Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

Garcia-Serrano, J. / Koshizaki, N. / Sasaki, T. et al. | British Library Online Contents | 2001