Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Extremely deep SIMS profiling: oxygen in FZ silicon
Extremely deep SIMS profiling: oxygen in FZ silicon
Extremely deep SIMS profiling: oxygen in FZ silicon
Barcz, A. (Autor:in) / Zielinski, M. (Autor:in) / Nossarzewska, E. (Autor:in) / Lindstroem, G. (Autor:in)
APPLIED SURFACE SCIENCE ; 203-204 ; 396-399
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS
| British Library Online Contents | 2003
SIMS depth profiling and TEM imaging of the SIMS altered layer
| British Library Online Contents | 2008
TOF-SIMS depth profiling of SIMON
| British Library Online Contents | 2003
Effect of primary oxygen ion implantation on SIMS depth profiling in glasses
| British Library Online Contents | 2006
Apparent and real transient effects in SIMS depth profiling using oxygen bombardment
| British Library Online Contents | 2003