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Status and open problems in modeling of as-implanted damage in silicon
Status and open problems in modeling of as-implanted damage in silicon
Status and open problems in modeling of as-implanted damage in silicon
Hobler, G. (Autor:in) / Otto, G. (Autor:in)
01.01.2003
14 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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