Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices: Fid-Bau Portal

Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices

Dudley, M. / Huang, X. / Vetter, W. M. / Neudeck, P. G.

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Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices

Dudley, M. / Huang, X. / Vetter, W. M. / Neudeck, P. G.

Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices

Dudley, M. / Huang, X. / Vetter, W. M. / Neudeck, P. G.

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Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Titel:

Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices

Beteiligte:

Dudley, M. (Autor:in) / Huang, X. (Autor:in) / Vetter, W. M. (Autor:in) / Neudeck, P. G. (Autor:in) / Bergman, P. / Janzen, E.

Erschienen in:

Silicon Carbide and Related Materials 2002 ; 247-252

MATERIALS SCIENCE FORUM ; 433/436

Erscheinungsdatum:

01.01.2003

Format / Umfang:

6 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Dudley, M. / Huang, W. / Vetter, W. M. et al. | British Library Online Contents | 2000

Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

Dudley, M. / Bai, J. / Huang, X. et al. | British Library Online Contents | 2006

Characterization of SiC Using Synchrotron White Beam X-Ray Topography

Dudley, M. / Huang, X. | British Library Online Contents | 2000

High-resolution x-ray topography of dislocations in 4H-SiC epilayers

Kamata, I. / Tsuchida, H. / Vetter, W. M. et al. | British Library Online Contents | 2007

High-Resolution Topography Analysis on Threading Edge Dislocations in 4H-SiC Epilayers

Kamata, I. / Nagano, M. / Tsuchida, H. et al. | British Library Online Contents | 2009

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