Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Stahlbush, R. E. / Fedison, J. B. / Arthur, S. D. et al. | British Library Online Contents | 2002

Partial Dislocations and Stacking Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Fatemi, M. et al. | British Library Online Contents | 2004

Recombination Behavior of Stacking Faults in SiC p-i-n Diodes

Maximenko, S. I. / Pirouz, P. / Sudarshan, T. S. | British Library Online Contents | 2006

Microstructural Characterization of Recombination-Induced Stacking Faults in High-Voltage SiC Diodes

Liu, J. Q. / Skowronski, M. / Hallin, C. et al. | British Library Online Contents | 2002

Electronic Properties of Stacking Faults in 15R-SiC

Iwata, H. / Lindefelt, U. / Oberg, S. et al. | British Library Online Contents | 2003