Microstructural Characterization of Recombination-Induced Stacking Faults in High-Voltage SiC Diodes

Liu, J. Q. / Skowronski, M. / Hallin, C. et al. | British Library Online Contents | 2002

Partial Dislocations and Stacking Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Fatemi, M. et al. | British Library Online Contents | 2004

Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes

Jacobson, H. / Bergman, J. P. / Hallin, C. et al. | British Library Online Contents | 2003

Effect of Stacking Faults Originating from Half Loop Arrays on Electrical Behavior of 10 kV 4H-SiC PiN Diodes

Stahlbush, R.E. / Zhang, Q.C. / Agarwal, A.K. et al. | British Library Online Contents | 2012

Formation of Stacking Faults in Diffused SiC p^+/n^-/n^+ and p^+/p^-/n^+ Diodes

Soloviev, S. / Cherednichenko, D. / Sudarshan, T. S. | British Library Online Contents | 2004