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Progress towards a physical contact model for scanning spreading resistance microscopy
Progress towards a physical contact model for scanning spreading resistance microscopy
Progress towards a physical contact model for scanning spreading resistance microscopy
Eyben, P. (Autor:in) / Denis, S. (Autor:in) / Clarysse, T. (Autor:in) / Vandervorst, W. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 132-137
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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