Surface and interface analysis of tris-(8-hydroxyquinoline) aluminum and indium-tin-oxide using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Zheng, D. / Li, H. / Wang, Y. et al. | British Library Online Contents | 2001

Membrane surface modification and characterization by X-ray photoelectron spectroscopy, atomic force microscopy and contact angle measurements

Khayet, M. | British Library Online Contents | 2004

Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Gu-ping, O. / Wen-ming, G. / Shi-chao, J. et al. | British Library Online Contents | 2006

Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

Komolov, A. / Schaumburg, K. / Moller, P.J. et al. | British Library Online Contents | 1999

Interface properties of bilayer structure Alq3/Fe65Co35

Wang, Z. / Xu, C. / Wang, J. et al. | British Library Online Contents | 2015