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High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling
High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling
High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling
Barge, D. (Autor:in) / Pichaud, B. (Autor:in) / Joly, J. P. (Autor:in)
APPLIED SURFACE SCIENCE ; 226 ; 341-346
01.01.2004
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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