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Hafnium oxide gate dielectrics grown from an alkoxide precursor: structure and defects
Hafnium oxide gate dielectrics grown from an alkoxide precursor: structure and defects
Hafnium oxide gate dielectrics grown from an alkoxide precursor: structure and defects
Frank, M. M. (Autor:in) / Sayan, S. (Autor:in) / Dormann, S. (Autor:in) / Emge, T. J. (Autor:in) / Wielunski, L. S. (Autor:in) / Garfunkel, E. (Autor:in) / Chabal, Y. J. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 109 ; 6-10
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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