Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Investigation on dispersion of optical constants of Gd2O3 films by phase modulated spectroscopic ellipsometry

    New search for: Bhattacharyya, D.
    New search for: Biswas, A.
    New search for: Sahoo, N. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Investigation on dispersion of optical constants of Gd2O3 films by phase modulated spectroscopic ellipsometry

    New search for: Bhattacharyya, D.
    New search for: Biswas, A.
    New search for: Sahoo, N. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation on dispersion of optical constants of Gd2O3 films by phase modulated spectroscopic ellipsometry

    New search for: Bhattacharyya, D.
    New search for: Biswas, A.
    New search for: Sahoo, N. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Investigation on dispersion of optical constants of Gd2O3 films by phase modulated spectroscopic ellipsometry

    Contributors:

    Bhattacharyya, D. (author) / Biswas, A. (author) / Sahoo, N. K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 233 ; 155-162

    Publication date:

    2004-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

    Sahoo, N. K. / Senthilkumar, M. / Thakur, S. et al. | British Library Online Contents | 2002

    Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

    Sahoo, N. K. / Tokas, R. B. / Thakur, S. | British Library Online Contents | 2006

    Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

    Senthil, K. / Mangalaraj, D. / Narayandass, S. K. et al. | British Library Online Contents | 2000

    Dielectric and optical constants of λ-Ti3O5 film measured by spectroscopic ellipsometry

    Hakoe, Fumiyoshi / Tokoro, Hiroko / Ohkoshi, Shin-ichi | British Library Online Contents | 2017

    Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

    Garcia-Serrano, J. / Koshizaki, N. / Sasaki, T. et al. | British Library Online Contents | 2001

    Back to top