Forward-Bias Degradation in 4H-SiC p^+nn^+ Diodes: Influence of the Mesa Etching

Camara, N. / Thuaire, A. / Bano, E. et al. | British Library Online Contents | 2005

Fabrication and Simulation of 4H-SiC PiN Diodes Having Mesa Guard Ring Edge Termination

Sankin, I. / Dufrene, J. B. / Merrett, J. N. et al. | British Library Online Contents | 2003

Investigation of process technologies for the fabrication of AlGaInP mesa ultra high brightness light emitting diode

Schineller, B. / Junas, Y. / Heuken, M. et al. | British Library Online Contents | 1998

Quezon and Sta. Mesa high type pavements

Orosa, V. | Engineering Index Backfile | 1947

Investigation of Epitaxial SiC PiN Diodes with Variable Mesa Height

Paques, G. / Scharnholz, S. / Konrath, J.P. et al. | British Library Online Contents | 2011