Study of Forward Voltage Drift in Diffused SiC PiN Diodes Doped by Al or B

Maximenko, S. / Soloviev, S. / Grekov, A. et al. | British Library Online Contents | 2005

Evolution of Drift-Free, High Power 4H-SiC PiN Diodes

Das, M. K. / Sumakeris, J. J. / Hull, B. A. et al. | British Library Online Contents | 2006

Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes

Bergman, J. P. / Lendenmann, H. / Nilsson, P. A. et al. | British Library Online Contents | 2001

Correlation between Carrier Recombination Lifetime and Forward Voltage Drop in 4H-SiC PiN Diodes

Chung, G.Y. / Loboda, M.J. / Sundaresan, S.G. et al. | British Library Online Contents | 2010

Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Stahlbush, R. E. / Fedison, J. B. / Arthur, S. D. et al. | British Library Online Contents | 2002