Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Crystallographic Defects under Surface Morphological Defects of 4H-SiC Homoepitaxial Films
Crystallographic Defects under Surface Morphological Defects of 4H-SiC Homoepitaxial Films
Crystallographic Defects under Surface Morphological Defects of 4H-SiC Homoepitaxial Films
Okada, T. (Autor:in) / Kimoto, T. (Autor:in) / Yamai, K. (Autor:in) / Matsunami, H. (Autor:in) / Inoko, F. (Autor:in)
MATERIALS SCIENCE FORUM ; 457/460 ; 521-524
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Origin of Surface Morphological Defects in 4H-SiC Homoepitaxial Films
British Library Online Contents | 2006
|Correlation between Surface Morphological Defects and Crystallographic Defects in SiC
British Library Online Contents | 2012
|British Library Online Contents | 2012
|British Library Online Contents | 2006
|Structure and Origin of Carrot Defects on 4H-SiC Homoepitaxial Layers
British Library Online Contents | 2014
|