Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Improved charge neutralization method for depth profiling of bulk insulators using O~2^+ primary beam on a magnetic sector SIMS instrument
Improved charge neutralization method for depth profiling of bulk insulators using O~2^+ primary beam on a magnetic sector SIMS instrument
Improved charge neutralization method for depth profiling of bulk insulators using O~2^+ primary beam on a magnetic sector SIMS instrument
Pivovarov, A. L. (Autor:in) / Stevie, F. A. (Autor:in) / Griffis, D. P. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 786-790
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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