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Improved charge neutralization method for depth profiling of bulk insulators using O~2^+ primary beam on a magnetic sector SIMS instrument
Improved charge neutralization method for depth profiling of bulk insulators using O~2^+ primary beam on a magnetic sector SIMS instrument
Improved charge neutralization method for depth profiling of bulk insulators using O~2^+ primary beam on a magnetic sector SIMS instrument
Pivovarov, A. L. (author) / Stevie, F. A. (author) / Griffis, D. P. (author)
APPLIED SURFACE SCIENCE ; 231/232 ; 786-790
2004-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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