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Observation of strain field fluctuation in SiGe-relaxed buffer layers and its influence on overgrown structures
Observation of strain field fluctuation in SiGe-relaxed buffer layers and its influence on overgrown structures
Observation of strain field fluctuation in SiGe-relaxed buffer layers and its influence on overgrown structures
Sawano, K. (Autor:in) / Usami, N. (Autor:in) / Arimoto, K. (Autor:in) / Koh, S. (Autor:in) / Nakagawa, K. (Autor:in) / Shiraki, Y. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 8 ; 177-180
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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